关于“[DEPRECATED] Detect Manufacturing Defects using Visual Inspection AI: Challenge Lab”的评价

Aditya P. · 评论over 1 year之前

Mandira H. · 评论over 1 year之前

anushka s. · 评论over 1 year之前

Meet P. · 评论over 1 year之前

Dinur S. · 评论over 1 year之前

Xerox G. · 评论over 1 year之前

Pradip B. · 评论over 1 year之前

Shubham B. · 评论over 1 year之前

Good Lab

Tanishq S. · 评论over 1 year之前

Syed M. · 评论over 1 year之前

Harsha T. · 评论over 1 year之前

Aman K. · 评论over 1 year之前

Sai Rohith M. · 评论over 1 year之前

nice

Dhanashree L. · 评论over 1 year之前

Van Khanh N. · 评论over 1 year之前

Mahesh K. · 评论over 1 year之前

Mahesh Kumar P. · 评论over 1 year之前

mahesh kumar p. · 评论over 1 year之前

Mohitsing Sanjaysing P. · 评论over 1 year之前

Siddharth J. · 评论over 1 year之前

SATHI G. · 评论over 1 year之前

Mujeeb N. · 评论over 1 year之前

nice

Dhanashree L. · 评论over 1 year之前

Prashant_ C. · 评论over 1 year之前

Himanshu K. · 评论over 1 year之前